Olympus’ LEXT OLS5000 3D measuring laser microscope helps users reach a higher level of metrology. With dedicated objectives, an improved scanning algorithm and a 210mm extension frame, the new LEXT can accommodate and measure a larger range of samples – as well as save time and improve productivity.
Acquiring highly accurate data in less time, the OLS5000 microscope incorporates a PEAK algorithm for 3D data construction. This algorithm, combined with an intelligent Skip Scan function, has reduced data acquisition times by 75 per cent. These time savings make the new OLS5000 well suited for high throughput applications, such as quality control in the automotive, electronic component and semiconductor industries.
With the new extension frame of the OLS5000, samples of up to 210mm can be analysed. Furthermore, with an ultra-long working distance objective it is possible to measure dents of up to 25mm and carry out comprehensive inspection of even the most challenging samples.
To capture any surface at any angle, the OLS5000 is equipped with 4K scanning technology that can capture steep slopes of up to 87.5°. Olympus has also designed dedicated objectives for the OLS5000 that perform uniform measurements across the entire field of view. Finally, a Smart Judge function was added that reliably distinguishes between steps on a sample and noise. These improvements make it possible to scan a larger number of different samples and improve confidence in the results.
