Zygo a developer of precision metrology instruments and optics, has announced the release of version 9.0 of its Mx software platform for complete instrument control and data analysis.
Ease-of-use is central to two key new capabilities in Mx 9.0: support for Zygo’s Verifire Asphere+ (VFA+) instrument and the addition of a ‘Robust Films’ module that allows easy measurement of very rough films.
Version 9.0 builds on the strengths of Zygo’s Mx software, including interactive 3D maps, quantitative phase data, intuitive navigation, & built-in SPC with statistics, control charting, and pass/fail limits. The latest update allows users of the VFA+, Zygo’s latest metrology platform designed to measure axisymmetric aspheres, to get from mounting a part to measurement and insight in just a few clicks. The user interface and software architecture have been redesigned from the customer’s perspective, prioritising ease of use and accessibility. The focus was to dramatically simplify the user interface, making it more graphical, and more task- and flow-oriented.
Mx 9.0 also provides a general toolkit for asphere analysis. Aspheres are made for numerous industry sectors and span a wide range of sizes and geometries, and customers can measure aspheres using a variety of ZYGO optical metrology instruments. The Mx asphere analysis toolkit can be used with any instrument, in alignment with the user’s job steps — design, make, measure, and analyse.
Mx 9.0 improves the user experience for other applications as well, including measuring parts with transparent films. With this latest release, Zygo has advanced the state of the art in signal processing for optical profilers, enabling characterisation of rough films on a rough substrate that have always proved challenging. These advances are now built in to Mx 9.0, improving the robustness of coated surface metrology, and enabling characterisation of a whole new range of surfaces.
Mx 9.0 is now shipping on all new metrology systems and is available for upgrades on supported instruments.
