Sensofar Metrology has released the fifth generation of its optical profiler. Engineered for speed, the S Neox is a non-contact 3D optical profiler microscope system, designed for sub-nano, nano and micro-scale measurement, with advanced inspection and analysis capabilities.
The S Neox’s design has been improved in terms of flexibility, stability, and durability required for both R&D and QC laboratories. The company’s optimised solutions are able to work in QC environments thanks to their flexibility and easy-to-use interface and can be programmed to work 24/7.
The S Neox is ideal for all lab environments. The most significant features are: new active illumination focus variation developed for measuring the shape of large rough surfaces; new thin film measurement technique, which allows the user to measure the thickness of optically transparent layers quickly, accurately, non-destructively and with no sample preparation; and differential interference contrast (DIC) has been added to emphasise very small height features.
