The SPIE Defense and Security event, which will take place on 16-20 March, 2008, is expected to attract more than 5,300 attendees and 450 exhibitors.
The event will include 45 conferences set to cover optics, sensors, and IR imaging, and more than 60 courses will be available. Exhibitors include nine out of the top ten global defence contractors.
Topics for the conferences include: optical pattern recognition, signal processing, infrared imaging systems, unattended ground, sea and air sensors and biometric identification. The courses will touch on: precision stabilisation and laser pointing systems, imaging polarimetry, network-centric target tracking and classification and IP issues.
Other events include plenaries, lunches, networking events, and a banquet. This year’s programme features a plenary presentation from Jay Cohen, under secretary for science and technology at the US Department of Homeland Security.
