WITec's True Surface Microscopy has been selected as a winner of the prestigious 2011 R&D 100 Award. It honours the WITec innovation as one of the 100 most technologically significant developments of the year. True Surface Microscopy allows confocal Raman imaging guided by surface topography. The topographic coordinates measured from an integrated profilometer are used to perfectly follow the sample surface in confocal Raman imaging mode. The result is an image revealing optical or chemical properties at the surface of the sample, even if this surface is very rough or heavily inclined. Previously in March 2011, True Surface Microscopy received the Pittcon 2011 Editors Gold Award.
'With True Surface Microscopy we have made another technological leap which will enable our customers to explore new avenues in their scientific field,' says Dr Olaf Hollricher, managing director of research and development at the company. 'This second award further validates our claim of always providing cutting-edge innovations and is a great recognition of the success of our product strategy.'
The internationally recognised award was established in 1963 and is selected by an independent panel of judges as well as the editors of R&D Magazine, and is presented every year to outstanding innovations in industrial research and development. In 2008 WITec received the R&D 100 Award for its alpha500 automated confocal Raman and Atomic Force Microscope platform. The judges choose breakthrough products or processes that can contribute to changing people`s lives or redefining current technology.
