Lot-Oriel has introduced its T-Solar ellipsometer, combining various photovoltaic measurement technologies into a single system designed specifically for textured samples. Based on the established M-2000 rotating compensator spectroscopic ellipsometer, T-Solar measures hundreds of wavelengths across the UV, visible, and NIR ranges.
To improve performance on rough, textured surfaces that significantly reduce reflected signal, T-Solar combines a special high-intensity lamp source with the company's new intensity-optimiser.
T-Solar is well-suited to characterising AR coatings on etched silicon surfaces. In addition, it features an adjustable tilt-rotation-stage, which is used to align the pyramid structures of alkaline-etched monocrystalline surfaces.