A NEW SPECTRAL ANALYSIS SYSTEM DESIGNED TO MEASURE HIGH-PERFORMANCE OPTICAL FILTERS

Measurement limitations present a unique challenge to thin-film coating manufacturers as optical interference filters and coatings become more advanced. Learn about a custom solution specifically designed to measure high-performance optical filters.

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A NEW SPECTRAL ANALYSIS SYSTEM DESIGNED TO MEASURE HIGH-PERFORMANCE OPTICAL FILTERS

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Introducing the October issue of Electro Optics