Distributor Armstrong Optical has introduced the new differential interferometer from German manufacturer SIOS. The new device can be used in a lab or easily incorporated into OEM equipment for high accuracy parallelism measurements. The system employs a SIOS stabilised and calibrated HeNe laser and can provide resolutions in the 0.1nm region. This is accompanied by the introduction of the new RE10 interface card which offers sample rates of up to 12.5MHz for fast vibration measurements.
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